データシートサーチシステム |
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ISL43145IV データシート(PDF) 9 Page - Intersil Corporation |
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ISL43145IV データシート(HTML) 9 Page - Intersil Corporation |
9 / 16 page 9 FN6037.4 August 31, 2015 FIGURE 3A. MEASUREMENT POINTS CL includes fixture and stray capacitance. Reconfigure accordingly to test SW3 and SW4. FIGURE 3B. TEST CIRCUIT FIGURE 3. BREAK-BEFORE-MAKE TIME (ISL43145 ONLY) Repeat test for all switches. FIGURE 4. OFF ISOLATION TEST CIRCUIT Repeat test for all switches. FIGURE 5. RON TEST CIRCUIT FIGURE 6. CROSSTALK TEST CIRCUIT FIGURE 7. CAPACITANCE TEST CIRCUIT Test Circuits and Waveforms (Continued) 90% 3V 0V tD 0V LOGIC INPUT SWITCH OUTPUT SWITCH OUTPUT 90% tD 0V VOUT1 VOUT2 90% 90% LOGIC INPUT IN1 COM1 RL1 CL1 VOUT1 300 35pF COM2 RL2 CL2 VOUT2 300 35pF NO1 NC2 GND IN2 VNX V+ C C V- C ANALYZER RL SIGNAL GENERATOR V+ C 0V or 2.4V NO or NC COM IN GND C V- V+ C 0.8V or 2.4V NO or NC COM IN GND VNX V1 RON = V1/1mA 1mA C V- 0V or 2.4V ANALYZER V+ C NO1 or NC1 SIGNAL GENERATOR RL GND IN2 COM1 IN2 50 0V or 2.4V NO COM2 NO2 or NC2 C V- CONNECTION V+ GND NO or NC COM IN IMPEDANCE ANALYZER 0V or 2.4V V- ISL43143, ISL43144, ISL43145 |
同様の部品番号 - ISL43145IV |
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同様の説明 - ISL43145IV |
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