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TL751M08-Q1 データシート(PDF) 4 Page - Texas Instruments |
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TL751M08-Q1 データシート(HTML) 4 Page - Texas Instruments |
4 / 23 page TL750Mxx-Q1, TL751Mxx-Q1 SGLS312J – SEPTEMBER 2005 – REVISED JUNE 2011 www.ti.com TL751Mxx ELECTRICAL CHARACTERISTICS VI = 14 V, IO = 300 mA, TJ = 25°C TL751Mxx PARAMETER UNIT TYP Response time, ENABLE to output (start-up) 50 µs TL750M05/TL751M05 ELECTRICAL CHARACTERISTICS VI = 14 V, IO = 300 mA, ENABLE at 0 V for TL751M05, TJ = –40°C to 125°C (unless otherwise noted) (1) TL750M05 TL751M05 PARAMETER TEST CONDITIONS UNIT MIN TYP MAX Output voltage VI = 6 V to 26 V 4.85 5 5.15 V VI = 9 V to 16 V, IO = 250 mA 10 25 Line regulation mV VI = 6 V to 26 V, IO = 250 mA 12 50 Power-supply ripple rejection VI = 8 V to 18 V, f = 120 Hz 55 dB Load regulation IO = 5 mA to 750 mA 20 50 mV IO = 500 mA, TJ = 25°C 0.5 Dropout voltage(2) V IO = 750 mA, TJ = 25°C 0.65 IO = 750 mA 60 75 Current consumption mA Iq = II – IO IO = 10 mA 5 Shutdown current (TL751M05 only) ENABLE VIH ≥ 2 V 200 µA (1) Pulse-testing techniques maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must be taken into account separately. All characteristics are measured with a 0.1- µF capacitor across the input and a 10-µF tantalum capacitor on the output, with equivalent series resistance within the guidelines shown in Figure 4. (2) Measured when the output voltage, VO, has dropped 100 mV from the nominal value obtained at VI = 14 V. TL750M08/TL751M08 ELECTRICAL CHARACTERISTICS VI = 14 V, IO = 300 mA, ENABLE at 0 V for TL751M08, TJ = –40°C to 125°C (unless otherwise noted) (1) TL750M08 TL751M08 PARAMETER TEST CONDITIONS UNIT MIN TYP MAX Output voltage VI = 6 V to 26 V 7.76 8 8.24 V VI = 10 V to 17 V, IO = 250 mA 12 40 Line regulation mV VI = 9 V to 26 V, IO = 250 mA 15 68 Power-supply ripple rejection VI = 11 V to 21 V, f = 120 Hz 55 dB Load regulation IO = 5 mA to 750 mA 24 80 mV IO = 500 mA, TJ = 25°C 0.5 Dropout voltage(2) V IO = 750 mA, TJ = 25°C 0.65 IO = 750 mA, TJ = 25°C 60 75 Current consumption mA Iq = II – IO IO = 10 mA 5 Shutdown current (TL751M08 only) ENABLE VIH ≥ 2 V 200 µA (1) Pulse-testing techniques maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must be taken into account separately. All characteristics are measured with a 0.1- µF capacitor across the input and a 10-µF tantalum capacitor on the output, with equivalent series resistance within the guidelines shown in Figure 4. (2) Measured when the output voltage, VO, has dropped 100 mV from the nominal value obtained at VI = 14 V. 4 Copyright © 2005–2011, Texas Instruments Incorporated |
同様の部品番号 - TL751M08-Q1_15 |
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同様の説明 - TL751M08-Q1_15 |
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