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LC75843UGA データシート(PDF) 2 Page - ON Semiconductor

部品番号 LC75843UGA
部品情報  Duty General-Purpose LCD Driver
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メーカー  ONSEMI [ON Semiconductor]
ホームページ  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

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LC75843UGA
No.A2226-2/35
Specifications
Absolute Maximum Ratings at Ta = 25
C, VSS = 0V
Parameter
Symbol
Conditions
Ratings
Unit
Maximum supply voltage
VDD max
VDD
-0.3 to +6.8
V
Input voltage
VIN
CE, CL, DI, INH, OSCI
-0.3 to +6.8
V
Output voltage
VOUT
S1 to S28, COM1 to COM4, P1 to P4
-0.3 to VDD+0.3
V
Output current
IOUT1
S1 to S28
300
A
IOUT2
COM1 to COM4
3
mA
IOUT3
P1 to P4
5
Allowable power dissipation
Pd max
Ta = 105
C
50
mW
Operating temperature
Topr
-40 to +105
C
Storage temperature
Tstg
-55 to +125
C
Allowable Operating Ranges at Ta = -40 to +105
C, VSS = 0V
Parameter
Symbol
Conditions
Ratings
Unit
min
typ
max
Supply voltage
VDD
VDD
4.5
6.3
V
Input high level voltage
VIH1
CE, CL, DI, INH
0.4VDD
6.3
V
VIH2
OSCI
0.4VDD
6.3
Input low level voltage
VIL1
CE, CL, DI, INH
0
0.2VDD
V
VIL2
OSCI
0
0.2VDD
External clock operating frequency
fCK
OSCI, External clock operating mode [Figure 3]
10
300
600
kHz
External clock duty cycle
DCK
OSCI, External clock operating mode [Figure 3]
30
50
70
%
Data setup time
tds
CL, DI
[Figure 1], [Figure 2]
160
ns
Data hold time
tdh
CL, DI
[Figure 1], [Figure 2]
160
ns
CE wait time
tcp
CE, CL
[Figure 1], [Figure 2]
160
ns
CE setup time
tcs
CE, CL
[Figure 1], [Figure 2]
160
ns
CE hold time
tch
CE, CL
[Figure 1], [Figure 2]
160
ns
High level clock pulse width
t
H
CL
[Figure 1], [Figure 2]
160
ns
Low level clock pulse width
t
L
CL
[Figure 1], [Figure 2]
160
ns
Rise time
tr
CE, CL, DI
[Figure 1], [Figure 2]
160
ns
Fall time
tf
CE, CL, DI
[Figure 1], [Figure 2]
160
ns
INH switching time
tc
INH, CE
[Figure 4], [Figure 5]
[Figure 6], [Figure 7]
10
s
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.


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