LC72722PMS

No. A2156-2/18

Specifications

Absolute Maximum Ratings at Ta = 25

°C, Vssd = Vssa = 0V

Symbol

Pin Name

Ratings

Unit

Maximum supply voltage

Vddmax

Vddd, Vdda

-0.3 to +7.0

V

Maximum input voltage

Vin1max

CL, DI, CE, SYR, T1, T2, T3, T4, T5, T6, T7, SYNC

-0.3 to +7.0

V

Vin2max

XIN

-0.3 to Vddd+0.3

V

Vin3max

MPXIN, CIN

-0.3 to Vdda+0.3

V

Maximum output voltage

Vo1max

DO, SYNC, RDS-ID, T3, T4, T5, T6, T7

-0.3 to +7.0

V

Vo2max

XOUT

-0.3 to Vddd+0.3

V

Vo3max

FLOUT

-0.3 to Vdda+0.3

V

Maximum output current

Io1max

DO, T3, T4, T5, T6, T7

+6.0

mA

Io2max

XOUT, FLOUT

+3.0

mA

Io3max

SYNC, RDS-ID

+20.0

mA

Allowable power dissipation

Pdmax

(Ta

≤85°C)

175

mW

Operating temperature

Topr

-40 to +85

°C

Storage temperature

Tstg

-55 to +125

°C

Allowable Operating Ranges at Ta = -40 to 85

°C, Vssd = Vssa = 0V

Parameter

Symbol

Pin Name

Conditions

Ratings

Unit

min

typ

max

Supply voltage

Vdd1

Vddd, Vdda

4.5

5.0

5.5

V

Vdd2

Vddd

Serial data hold voltage

2.0

V

Input high-level

voltage

VIH

CL, DI, CE, SYR, T1, T2

0.7Vddd

6.5

V

Input low-level voltage

VIL

CL, DI, CE, SYR, T1, T2

0

0.3Vddd

V

Output voltage

VO

DO, SYNC, RDS-ID, T3,

T4, T5, T6, T7

6.5

V

Input amplitude

VIN1

MPXIN

f=57

±2kHz

50

mVrms

VIN2

100% modulation composite

100

mVrms

VXIN

XIN

400

1500

mVrms

Guaranteed crystal

Oscillator frequencies

XTAL

XIN, XOUT

CI

≤120Ω (XS=0)

4.332

MHz

CI

≤70Ω (XS=1)

8.664

MHz

Crystal oscillator

frequency

deviation

TXtal

XIN, XOUT

fo=4.332MHz, 8.664MHz

±100

ppm

Data setup time

tSU

DI, CL

0.75

μs

Data hold time

tHD

DI, CL

0.75

μs

Clock low level time

tCL

CL

0.75

μs

Clock high level time

tCH

CL

0.75

μs

CE wait time

tEL

CE, CL

0.75

μs

CE setup time

tES

CE, CL

0.75

μs

CE hold time

tEH

CE, CL

0.75

μs

CE high-level time

tCE

CE

20

ms

Data latch change

time

tLC

1.15

μs

Data output time

tDC

DO,CL

Differs depending on the value

of the pull-up resistor used.

0.46

μs

tDH

DO,CE

0.46

μs

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating

Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.