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SI4844-B20 データシート(PDF) 10 Page - Silicon Laboratories |
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SI4844-B20 データシート(HTML) 10 Page - Silicon Laboratories |
10 / 27 page Si4844-B20 10 Rev. 1.0 Table 7. Reference Clock and Crystal Characteristics (VDD = 2.7 to 3.6 V, TA = –15 to 85 °C) Parameter Symbol Test Condition Min Typ Max Unit Reference Clock XTALI Supported Reference Clock Frequencies* 31.130 32.768 40,000 kHz Reference Clock Frequency Tolerance for XTALI –100 — 100 ppm REFCLK_PRESCALE 14095 REFCLK 31.130 32.768 34.406 kHz Crystal Oscillator Crystal Oscillator Frequency —32.768 — kHz Crystal Frequency Tolerance –100 — 100 ppm Board Capacitance —— 3.5 pF *Note: The Si4844-B20 divides the RCLK input by REFCLK_PROSCALE to obtain REFCLK. There are some RCLK frequencies between 31.130 kHz and 40 MHz that are not supported. For more details, see Table 9 of “AN610: Si48xx ATDD Programming Guide.” Table 8. Thermal Conditions Parameter Symbol Min Typ Max Unit Thermal Resistance* JA —80 — °C/W Ambient Temperature TA –15 25 85 °C Junction Temperature TJ —— 92 °C *Note: Thermal resistance assumes a multi-layer PCB with the exposed pad soldered to a topside PCB pad. |
同様の部品番号 - SI4844-B20 |
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同様の説明 - SI4844-B20 |
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