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LM1279 データシート(PDF) 3 Page - Texas Instruments

部品番号 LM1279
部品情報  110 MHz RGB Video Amplifier System with OSD
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メーカー  TI1 [Texas Instruments]
ホームページ  http://www.ti.com
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OBSOLETE
LM1279
www.ti.com
SNOS020B – SEPTEMBER 1998 – REVISED APRIL 2013
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ABSOLUTE MAXIMUM RATINGS
(1) (2)
Supply Voltage
Pins 2 and 16(3)
10V
Peak Video Output Source Current
Any One Amp Pins 13, 15, or 18
28 mA
Voltage at Any Input Pin (VIN)
VCC ≥ VIN ≥ GND
Power Dissipation (PD)
Above 25°C Derate Based on
θJA and TJ
2.1W
Thermal Resistance to Ambient (
θJA)
60°C/W
Thermal Resistance to Case (
θJA)
37°C/W
Junction Temperature (TJ)
150°C
ESD Susceptibility(4)
3.5 kV
ESD Machine Model(5)
300V
Storage Temperature
−65°C to 150°C
Lead Temperature
Soldering, 10 sec
265°C
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.
(2)
If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
(3)
VCC supply pins 2 and 16 must be externally wired together to prevent internal damage during VCC power on/off cycles.
(4)
Human body model, 100 pF discharged through a 1.5 k
Ω resistor.
(5)
Machine Model ESD test is covered by specification EIAJ IC-121-1981. A 200 pF cap is charged to the specified voltage, then
discharged directly into the IC with no external series resistor (resistance of discharge path must be under 50
Ω).
OPERATING RATINGS
(1)
Temperature Range
0°C to 70°C
Supply Voltage (VCC)
7.5V
≤ VCC ≤ 8.5V
(1)
Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured
specifications and test conditions, see the ELECTRICAL CHARACTERISTICS. The ensured specifications apply only for the test
conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions.
Copyright © 1998–2013, Texas Instruments Incorporated
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