データシートサーチシステム |
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LM1279 データシート(PDF) 3 Page - Texas Instruments |
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LM1279 データシート(HTML) 3 Page - Texas Instruments |
3 / 20 page OBSOLETE LM1279 www.ti.com SNOS020B – SEPTEMBER 1998 – REVISED APRIL 2013 These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. ABSOLUTE MAXIMUM RATINGS (1) (2) Supply Voltage Pins 2 and 16(3) 10V Peak Video Output Source Current Any One Amp Pins 13, 15, or 18 28 mA Voltage at Any Input Pin (VIN) VCC ≥ VIN ≥ GND Power Dissipation (PD) Above 25°C Derate Based on θJA and TJ 2.1W Thermal Resistance to Ambient ( θJA) 60°C/W Thermal Resistance to Case ( θJA) 37°C/W Junction Temperature (TJ) 150°C ESD Susceptibility(4) 3.5 kV ESD Machine Model(5) 300V Storage Temperature −65°C to 150°C Lead Temperature Soldering, 10 sec 265°C (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. (2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and specifications. (3) VCC supply pins 2 and 16 must be externally wired together to prevent internal damage during VCC power on/off cycles. (4) Human body model, 100 pF discharged through a 1.5 k Ω resistor. (5) Machine Model ESD test is covered by specification EIAJ IC-121-1981. A 200 pF cap is charged to the specified voltage, then discharged directly into the IC with no external series resistor (resistance of discharge path must be under 50 Ω). OPERATING RATINGS (1) Temperature Range 0°C to 70°C Supply Voltage (VCC) 7.5V ≤ VCC ≤ 8.5V (1) Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the ELECTRICAL CHARACTERISTICS. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. Copyright © 1998–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LM1279 |
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同様の説明 - LM1279 |
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