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CDCVF2310-EP データシート(PDF) 4 Page - Texas Instruments

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部品番号 CDCVF2310-EP
部品情報  2.5-V TO 3.3-V HIGH-PERFORMANCE CLOCK BUFFER
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メーカー  TI1 [Texas Instruments]
ホームページ  http://www.ti.com
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CDCVF2310-EP データシート(HTML) 4 Page - Texas Instruments

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CDCVF2310-EP
SCAS934 – DECEMBER 2012
www.ti.com
THERMAL INFORMATION
CDCVF2310
THERMAL METRIC(1)
PW
UNITS
24 PINS
θJA
Junction-to-ambient thermal resistance(2)
91.7
θJCtop
Junction-to-case (top) thermal resistance(3)
31.2
θJB
Junction-to-board thermal resistance(4)
46.4
°C/W
ψJT
Junction-to-top characterization parameter(5)
1.5
ψJB
Junction-to-board characterization parameter(6)
45.8
θJCbot
Junction-to-case (bottom) thermal resistance(7)
N/A
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2)
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3)
The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-
standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4)
The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(5)
The junction-to-top characterization parameter,
ψJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining
θJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6)
The junction-to-board characterization parameter,
ψJB, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining
θJA , using a procedure described in JESD51-2a (sections 6 and 7).
(7)
The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
Spacer
RECOMMENDED OPERATING CONDITIONS
(1)
MIN
NOM
MAX
UNIT
2.3
2.5
Supply voltage, VDD
V
3.3
3.6
VDD = 3 V to 3.6 V
0.8
Low-level input voltage, VIL
V
VDD = 2.3 V to 2.7 V
0.7
VDD = 3 V to 3.6 V
2
High-level input voltage, VIH
V
VDD = 2.3 V to 2.7 V
1.7
Input voltage, VI
0
VDD
V
VDD = 3 V to 3.6 V
12
High-level output current, IOH
mA
VDD = 2.3 V to 2.7 V
6
VDD = 3 V to 3.6 V
12
Low-level output current, IOL
mA
VDD = 2.3 V to 2.7 V
6
Operating junction temperature, TJ
–55
125
°C
(1)
Unused inputs must be held high or low to prevent them from floating.
4
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Copyright © 2012, Texas Instruments Incorporated
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