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LM3409HV-Q1 データシート(PDF) 4 Page - Texas Instruments |
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LM3409HV-Q1 データシート(HTML) 4 Page - Texas Instruments |
4 / 45 page 4 LM3409, LM3409-Q1, LM3409HV, LM3409HV-Q1 SNVS602L – MARCH 2009 – REVISED JUNE 2016 www.ti.com Product Folder Links: LM3409 LM3409-Q1 LM3409HV LM3409HV-Q1 Submit Documentation Feedback Copyright © 2009–2016, Texas Instruments Incorporated (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) If Military/Aerospace specified devices are required, contact the Texas Instruments Sales Office/Distributors for availability and specifications. 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) (2) MIN MAX UNIT VIN, EN, UVLO to GND LM3409, LM3409-Q1 –0.3 45 V LM3409HV, LM3409HV-Q1 –0.3 76 VIN to VCC, PGATE –0.3 7 V VIN to PGATE for 100 ns –2.8 9.5 V VIN to CSP, CSN –0.3 0.3 V COFF to GND –0.3 4 V COFF Current continuous ±1 mA IADJ Current continuous ±5 mA Junction temperature 150 °C Soldering information Lead temperature (Soldering, 10 s) 260 °C Infrared and convection reflow (15 s) 260 °C Storage temperature, Tstg –65 125 °C (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. (3) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification. (4) The human body model is a 100 pF capacitor discharged through a 1.5-k Ω resistor into each pin. 7.2 ESD Ratings VALUE UNIT LM3409 IN DGQ AND NFF PACKAGES V(ESD) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) ±1000 V Charged device model (CDM), per JEDEC specification JESD22-C101, all pins(2) ±1000 LM3409-Q1 IN DGQ AND NFF PACKAGES V(ESD) Electrostatic discharge Human body model (HBM), per AEC Q100-002(3)(4) ±2000 V Charged device model (CDM), per AEC Q100-011 ±1000 7.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT VIN LM3409, LM3409-Q1 6 42 V LM3409HV, LM3409HV-Q1 6 75 Junction temperature range, TJ −40 125 °C |
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同様の説明 - LM3409HV-Q1 |
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