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SN74AUP2G126YFPR データシート(PDF) 1 Page - Texas Instruments

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部品番号 SN74AUP2G126YFPR
部品情報  LOW-POWER DUAL BUS BUFFER GATE WITH 3-STATE OUTPUTS
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メーカー  TI1 [Texas Instruments]
ホームページ  http://www.ti.com
Logo TI1 - Texas Instruments

SN74AUP2G126YFPR データシート(HTML) 1 Page - Texas Instruments

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DCU PACKAGE
(TOP VIEW)
3
6
1Y
2Y
8
1
VCC
1OE
5
GND
4
2A
2
7
2OE
1A
The exposed center pad, if used, must be connected
only as a secondary GND or left electrically open.
V
CC
1
2
3
4
5
6
7
8
2OE
1Y
2A
GND
2Y
1A
1OE
RSE PACKAGE
(TOP VIEW)
1
8
2
7
3
6
1OE
1A
2Y
GND 4
5
VCC
2OE
1Y
2A
DQE PACKAGE
(TOP VIEW)
1OE
1A
GND
2Y
V
CC
2OE
1Y
2A
YFP OR YZP PACKAGE
(TOP VIEW)
4 5
3 6
2 7
1 8
A1
A2
B1
B2
C1
C2
D1
D2
SN74AUP2G126
www.ti.com
SCES687D – JANUARY 2007 – REVISED DECEMBER 2009
LOW-POWER DUAL BUS BUFFER GATE WITH 3-STATE OUTPUTS
Check for Samples: SN74AUP2G126
1
FEATURES
Available in the Texas Instruments NanoStar™
Wide Operating VCC Range of 0.8 V to 3.6 V
Package
Optimized for 3.3-V Operation
Low Static-Power Consumption
3.6-V I/O Tolerant to Support Mixed-Mode
(ICC = 0.9 μA Max)
Signal Operation
Low Dynamic-Power Consumption
tpd = 9.9 ns Max at 3.3 V
(Cpd = 4 pF Typ at 3.3 V)
Suitable for Point-to-Point Applications
Low Input Capacitance (Ci = 1.5 pF Typ)
Latch-Up Performance Exceeds 100 mA Per
Low Noise – Overshoot and Undershoot
JESD 78, Class II
<10% of VCC
ESD Performance Tested Per JESD 22
Input-Disable Feature Allows Floating Input
2000-V Human-Body Model
Conditions
(A114-B, Class II)
Ioff Supports Partial-Power-Down Mode
1000-V Charged-Device Model (C101)
Operation
Input Hysteresis Allows Slow Input Transition
and Better Switching Noise Immunity at Input
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
The AUP family is TI's premier solution to the industry's low-power needs in battery-powered portable
applications. This family ensures a very low static and dynamic power consumption across the entire VCC range
of 0.8 V to 3.6 V, resulting in an increased battery life. This product also maintains excellent signal integrity (see
Figure 1 and Figure 2).
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2007–2009, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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