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LMP93601NHZT データシート(PDF) 5 Page - Texas Instruments

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部品番号 LMP93601NHZT
部品情報  Low-Noise, High Gain, 3-Channel AFE for Thermopile Sensors
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メーカー  TI1 [Texas Instruments]
ホームページ  http://www.ti.com
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LMP93601NHZT データシート(HTML) 5 Page - Texas Instruments

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LMP93601
www.ti.com
SNAS633A – MARCH 2014 – REVISED SEPTEMBER 2014
7.5 Electrical Characteristics
Typical conditions: TA=+25⁰C, AVDD=IOVDD=3.3 V, INP1/INN1 enabled with VICM=AVDD/3. PGA gain=64, PGA over-range
masked, digital gain=1. SPS select=1057 SPS. fXCLK=4.00 MHz. Conversion power mode. XCAP1=1 uF. XCAP2=0.1 uF.
SYMBOL
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
INPUTS
Channel1 enabled with a 100 k
Ω resistor
80
dB
Crosstalk across input
XTLK
as input, channel 2 disabled with 1 V
channels
peak-peak , 100 Hz signal as input.
Differential input
10//7
M
Ω//pF (1)
impedance
Zin
Common mode input
100//4.5
M
Ω//pF(1)
impedance
IB
Input bias current
-1.3
nA
Input offset current on
-200
pA
Ios
Maximum of INP1-INN1, .., INP3-INN3
differential channels
Input offset current drift
-0.5
pA/
⁰C
TCIos
Maximum of INP1-INN1, .., INP3-INN3
on differential channels
Input referred offset
-15
1
+15
uV(2)
Vos
Input short on chip, PGA 64 DG =1, CH1
voltage
Input referred offset drift
50
nV/
⁰C
TCVos
Input short on chip
with temperature
Programmable gain settings =16; ± 3%
-64
+64
mV
Programmable gain settings =32; ± 3%
-32
+32
Input differential range
Vdiff
Programmable gain settings =64; ± 3%
-16
+16
for AVDD
≥3V
Programmable gain settings = 128; ± 3%
± 8
PGA bypass
±1
V
0.3
AVDD-
V(3)
PGA = 64 V/V; CMRR
≥ 80 dB
1.4
Input common mode
VICM
range.
PGA = 64 V/V ; CMRR
≥ 72 dB
0.4
AVDD-
-25 C to 85 C
1.45
See
Hz
BW
Channel bandwidth
Figure 16
265
SPS
530
ODR
Output data rate
1057
1326
Programmable gain
16, 32 , 64
V/V
settings
and 128
PGA
Bypass mode
1
V/V
Programmable gain
1, 2, 4, 8,
V/V
Digital Gain
settings
16 and 32
Programmable gain
16 - 4096
V/V
settings (analog and
Total AFE Gain
digital)
Gain steps
2 x
0.3 %
Gain error
GE
PGA bypassed
-0.3 %
GE drift with temperature
-9
ppm/
⁰C
(1)
Value from simulation
(2)
The input referred offset is measure by an on-chip short.
(3)
Temperature limits are ensured by statistical analysis or design
Copyright © 2014, Texas Instruments Incorporated
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