KIA431CAM datasheet(4/6 Pages) KEC

部品番号	KIA431CAM

部品情報	SEMICONDUCTOR

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メーカー	KEC [KEC(Korea Electronics)]

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4 / 6 page

2016. 03. 23

4/6

KIA431AA/BA/CA Series

Revision No : 3

Input

FIGURE 1-TEST CIRCUIT FOR VKA = Vref

off

I

KA

V

Input

FIGURE 3-TEST CIRCUIT FOR I off

KA

I

L

*C

1

R

2

R

150

FIGURE 4-TEST CIRCUIT FOR

satbility boundary conditions

FIGURE 2-TEST CIRCUIT FOR VKA > Vref

IK

VKA

Input

R1

R2

Iref

VKA = Vref ( 1+

) + Iref R1

R1

R2

Max.

Min.

T1

T2

AMBIENT TEMPERATURE

-

Vref (Min.)

Ta = T2 - T1

Vref

Vref = Vref (Max.)

Vref

Example :

ΔVref = 8.0mV and slope is positive,

Vref at 25℃=2.495V, ΔTa=70℃

0.008

×106

αVref =

= 45.8 ppm/

℃

70

×(2.495)

Note 2: The dynamic impedance Zka is defined as:

ΔVKA

|Zka| =

ΔIK

When the device is programmed with two external

resistors, R1 and R2, (refer to Figure 2) the total

dynamic impedance of the circuit is defined as:

R1

|Zka’| = |Zka| (1+

)

R2

Note 1:

The deviation parameter

ΔVref is defined as the differences

between the maximum and minimum values obtained over the

full operating ambient temperature range that applies.

* Note 1: Recommend using more than CL = 10uF

under IKA = 1mA

The average temperature coefficient of the Reference

input voltage,

ΔVref , is defined as:

ΔVref

(

)

× 106

ppm

Vref at 25℃

αVref (

) =

℃ΔTa

ΔVref × 106

=

ΔTa(Vref at 25℃)

αVref can be positive or negative depending on whether

Vref Min. or Vref Max. occurs at the lower ambient temperature.

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