TLE4968-1M

Functional Description

Data Sheet

9

Revision 1.0, 2013-04-07

2.4

Block Diagram

Figure 2-2

Functional Block Diagram TLE4968-1M

2.5

Functional Block Description

The chopped Hall IC switch comprises a Hall probe, bias generator, compensation circuits, oscillator and output

transistor.

The bias generator provides currents for the Hall probe and the active circuits. Compensation circuits stabilize the

temperature behavior and reduce influence of technology variations.

The active error compensation (chopping technique) rejects offsets in the signal path and the influence of

mechanical stress to the Hall probe caused by molding and soldering processes and other thermal stress in the

package. The chopped measurement principle together with the threshold generator and the comparator ensures

highly accurate and temperature stable magnetic thresholds.

The output transistor has an integrated overcurrent and overtemperature protection.

Voltage

Regulator

Bias and

Compensation

Circuits

Oscillator and

Sequencer

To All Subcircuits

Spinning Hall

Probe

Amplifier

Low Pass

Filter

Comparator

with

Hysteresis

Control

Overtemperature

& overcurrent

protection

GND

Q

Reference