SMP9317 datasheet(4/6 Pages) SUMMIT

部品番号	SMP9317

部品情報	Nonvolatile DACPOT??Electronic Potentiometer With Up/Down Counter Interface

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メーカー	SUMMIT [Summit Microelectronics, Inc.]

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4 / 6 page

4

SMP9317

2031-04 12/4/98

Symbol

Parameter

Min

Max

Unit

Test Method

VZAP

ESD Susceptibility

2000

V

MS-883, TM 3015

ILTH

Latch-Up

100

mA

JEDEC Standard 17

TDR

Data Retention

100

Years

MS-883, TM 1008

NEND

Endurance

1,000,000

Stores

MS-883, TM 1033

RELIABILITY CHARACTERISTICS (over recommended operating conditions unless otherwise specified)

2031 PGM T2.0

Notes:

1. IDD is the supply current drawn while the EEPROM is being updated. IDD does not include the current that flows through the Reference

resistor chain.

2.

CS, UP/DN and INC have internal pull-up resistors of approximately 200k

Ω. When the input is pulled to ground the resulting output

current will be VDD/200k

Ω.

3. TCVOUT is guaranteed but not tested.

Symbol

Parameter

Conditions

Min

Typ

Max

Units

IDD

Supply Current

CS = VIL to VIH

1.0

mA

during store, note 1

W/

INC HI

ISB

Supply Standby Current

CS = VIH

100

µA

IIH

Input Leakage Current

VIN = VDD

10

µA

IIL

Input Leakage Current, note 2

VIN = 0V

-25

µA

VIH

High Level Input Voltage

2

VDD

V

VIL

Low Level Input Voltage

VDD

≥ 4.5V

0

0.8

V

2031 PGM T4.1

DC ELECTRICAL CHARACTERISTICS

VDD = +2.7V to +5.5V, VH = VDD, VL = 0V, TA = -40

°C to +85°C, Unless otherwise specified

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