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TS68EN360MR33L データシート(PDF) 8 Page - ATMEL Corporation |
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TS68EN360MR33L データシート(HTML) 8 Page - ATMEL Corporation |
8 / 82 page 8 TS68EN360 2113A–HIREL–03/02 Note: 1. I denotes input, O denotes output and I/O is input/output. Clock and Test (Cont’d) Three-State TRIS Used to three-state all pins if QUICC is configured as a master. Always Sampled except during system reset. (I) Test Clock TCK Provides a clock for Scan test logic. (I) Test Mode Select TMS Controls test mode operations. (I) Test Data In TDI Serial test instructions and test data signal. (I) Test Data Out TDO Serial test instructions and test data signal. (O) Test Reset TRST Provides an asynchronous reset to the test controller. (I) Power Clock Synthesizer Power VCCSYN Power supply to the PLL of the clock synthesizer. Clock Synthesizer Ground GNDSYN Ground supply to the PLL of the clock synthesizer. Clock Out Power VCCCLK Power supply to clock out pins. Clock Out Ground GNDCLK Ground supply to clock out pins. Special Ground 1 GNDS1 Special ground for fast AC timing on certain system bus signals. Special Ground 2 GNDS2 Special ground for fast AC timing on certain system bus signals. System Power Supply and Return VCC, GND Power supply and return to the QUICC. -- No Connect NC4-NC1 Four no-connect pins. Table 1. System Bus Signal Index (Normal Operation) (Continued) Group Signal Name Mnemonic Function |
同様の部品番号 - TS68EN360MR33L |
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