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TCAN1042-Q1 データシート(PDF) 7 Page - Texas Instruments

部品番号 TCAN1042-Q1
部品情報  Automotive Fault Protected CAN Transceiver with CAN FD
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TCAN1042-Q1 データシート(HTML) 7 Page - Texas Instruments

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TCAN1042-Q1, TCAN1042V-Q1, TCAN1042H-Q1
TCAN1042HV-Q1, TCAN1042G-Q1, TCAN1042GV-Q1
TCAN1042HG-Q1, TCAN1042HGV-Q1
www.ti.com
SLLSES9B – FEBRUARY 2016 – REVISED MAY 2017
Product Folder Links: TCAN1042-Q1 TCAN1042V-Q1 TCAN1042H-Q1 TCAN1042HV-Q1 TCAN1042G-Q1
TCAN1042GV-Q1 TCAN1042HG-Q1 TCAN1042HGV-Q1
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Copyright © 2016–2017, Texas Instruments Incorporated
7.3 Recommended Operating Conditions
MIN
MAX
UNIT
VCC
5-V Bus Supply Voltage Range
4.5
5.5
V
VIO
I/O Level-Shifting Voltage Range
3
5.5
IOH(RXD)
RXD terminal HIGH level output current
–2
mA
IOL(RXD)
RXD terminal LOW level output current
2
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
(2)
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, High-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3)
The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(4)
The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-
standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(5)
The junction-to-top characterization parameter, ΨJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6)
The junction-to-board characterization parameter, ΨJB estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θJA, using a procedure described in JESD51-2a (sections 6 and 7).
7.4 Thermal Information
THERMAL METRIC(1)
TEST CONDITIONS
TCAN1042-Q1
UNIT
D (SOIC)
DRB (VSON)
8 Pins
8 Pins
RθJA
Junction-to-air thermal resistance
High-K thermal resistance(2)
105.8
40.2
°C/W
RθJB
Junction-to-board thermal resistance(3)
46.8
49.7
°C/W
RθJC(TOP)
Junction-to-case (top) thermal resistance(4)
48.3
15.7
°C/W
ΨJT
Junction-to-top characterization parameter(5)
8.7
0.6
°C/W
ΨJB
Junction-to-board characterization parameter(6)
46.2
15.9
°C/W
TTSD
Thermal shutdown temperature
170
170
°C
TTSD_HYS
Thermal shutdown hysteresis
5
5
°C
7.5 Power Rating
PARAMETER
TEST CONDITIONS
POWER DISSIPATION
UNIT
PD
Average power dissipation
VCC = 5 V, VIO = 5 V (if applicable), TJ = 27°C, RL = 60 Ω, S at 0
V, Input to TXD at 250 kHz, CL_RXD = 15 pF. Typical CAN
operating conditions at 500 kbps with 25% transmission
(dominant) rate.
52
mW
VCC = 5.5 V, VIO = 5.5 V (if applicable), TJ = 150°C, RL = 50 Ω,
S at 0 V, Input to TXD at 500 kHz, CL_RXD = 15 pF. Typical high
load CAN operating conditions at 1 Mbps with 50% transmission
(dominant) rate and loaded network.
124
mW


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