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LMK61E0-050M_017 データシート(PDF) 4 Page - Texas Instruments |
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LMK61E0-050M_017 データシート(HTML) 4 Page - Texas Instruments |
4 / 22 page 4 LMK61E0-050M, LMK61E0-155M, LMK61E0-156M, LMK61E2-100M, LMK61E2-125M LMK61E2-156M, LMK61E2-312M, LMK61A2-100M, LMK61A2-125M, LMK61A2-156M LMK61A2-312M, LMK61A2-644M, LMK61I2-100M SNAS676D – OCTOBER 2015 – REVISED OCTOBER 2017 www.ti.com Product Folder Links: LMK61E0-050M LMK61E0-155M LMK61E0-156M LMK61E2-100M LMK61E2-125M LMK61E2- 156M LMK61E2-312M LMK61A2-100M LMK61A2-125M LMK61A2-156M LMK61A2-312M LMK61A2-644M LMK61I2-100M Submit Documentation Feedback Copyright © 2015–2017, Texas Instruments Incorporated (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute maximum-rated conditions for extended periods may affect device reliability. 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT VDD Device supply voltage –0.3 3.6 V VIN Output voltage for logic inputs –0.3 VDD + 0.3 V VOUT Output voltage for clock outputs –0.3 VDD + 0.3 V TJ Junction temperature 150 °C TSTG Storage temperature –40 125 °C (1) JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process. 6.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±4000 V Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±1500 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT VDD Device supply voltage 3.135 3.3 3.465 V TA Ambient temperature –40 25 85 °C TJ Junction temperature LMK61X2 125 °C LMK61X0 115 °C tRAMP VDD power-up ramp time 0.1 100 ms (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. (2) The package thermal resistance is calculated on a 4 layer JEDEC board. (3) Connected to GND with 3 thermal vias (0.3-mm diameter). (4) ψJB (junction to board) is used when the main heat flow is from the junction to the GND pad. Please refer to Thermal Considerations section for more information on ensuring good system reliability and quality. 6.4 Thermal Information THERMAL METRIC(1) LMK61XX (2) (3) (4) UNIT SIA (QFM) 6 PINS Airflow (LFM) 0 Airflow (LFM) 200 Airflow (LFM) 400 RθJA Junction-to-ambient thermal resistance 55.2 46.4 43.7 °C/W RθJC(top) Junction-to-case (top) thermal resistance 34.6 n/a n/a °C/W RθJB Junction-to-board thermal resistance 37.7 n/a n/a °C/W ψJT Junction-to-top characterization parameter 11.3 17.6 22.5 °C/W ψJB Junction-to-board characterization parameter 37.7 41.5 40.1 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance n/a n/a n/a °C/W |
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同様の説明 - LMK61E0-050M_017 |
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